S-TEST Lab DRE
The S-TEST Lab DRE system is based on the DRE-01 dynamic rotation exciter.
A typical application here is the determination of the properties of MEMS sensors and sensor components in the development phase.
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Product details
- Electro-dynamic drive
- Frequency range: 1 Hz…5 kHz
- Very low cross-acceleration
- Max. payload: 500 g
- Max. angular velocity: 5300 °/s
- Max. angular acceleration: 2,5 · 106 °/s2
- Distortion factor (angular velocity): < 3%

DRE-01
The DRE-01 is used for calibration of gyro transducers (angular velocity/acceleration). It is also used for characterization of MEMS sensors. It features very low motion distortion, built-in overload protection and cooling for improved performance, and can be operated with any signal generator or vibration controller.
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S-TEST/2
Compact system level test solution (SLT) for sensors with digital interfaces.
The S-TEST/2 is used in development and testing or for quality assurance in the manufacturing process.
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VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®.
Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
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