S-TEST Lab AHF
The S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors or small components.
Those typical systems were especially designed for system testing at high frequencies and work well with our high-frequency exciters SE-09 and SE-11.
APPLICATIONS
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Product details
- Force rating 100 N
- Frequency range: SE-09: 3 Hz…50 (95) kHz / SE-11: 1 kHz…50 (95) kHz
- Sample rate 120/200 kS/s
- 24 Bit resolution
- SE-11 eligible for climate chamber
- Remote control for climate chamber
Software highlights
- Wide range of functions for R&D
- Sweep, Dwell, manual mode, script operation and remote control
- Spectral analysis and distortion factor measurement
- Supports laser vibrometer
- Spectral RMS measurement
- Extensive display functions
- Powerful filters

S-TEST/2
Compact system level test solution (SLT) for sensors with digital interfaces.
The S-TEST/2 is used in development and testing or for quality assurance in the manufacturing process.
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VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®.
Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
APPLICATIONS
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SE-09
Ideal for calibration laboratories, NMI (national metrology institutes) und MEMS tests – in frequencies up to 50 kHz and for devices up to 350 g. The SE-09 high-frequency vibration exciter with air bearings, specifically designed to meet the requirements of calibration laboratories and metrology institutes, as well as for the characterization of MEMS sensors.
APPLICATIONS
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