SPEKTRA S-TEST - The clever test solution for digital sensors

The smart SPEKTRA S-TEST solutions allow highly efficient characterization of your devices - from development phase up to industrial large-scale production.

Various stimuli e.g. acceleration, dynamic pressure, rotation rate, etc. can be provided for numerous sensors in the laboratory.

The system-level tester was especially developed for sensors and allows flexible and highly parallel matching and parameter verification while simulating the target application conditions.

SPEKTRA S-TEST systems are characterized by the following advantages:

1. Parallel testing of all DUTs without resource sharing
   • Each device under test (DUT) is assigned its own tester card. Each of these cards works as an independent tester. This tester per DUT architecture means that all resources (DC and AC) are exclusively available for each DUT.
2. High throughput with intelligence directly at the DUT
   • With this tester per DUT architecture, each DUT also has its own NIOS test controller for functional test processing.
   • A data rate between DUT, test controller and host is therefore no longer a limiting factor.
3. High integration capability
   • Small size and low power consumption
   • Test programs created during development can be transferred directly to production and quality assurance
   • Use of identical hardware and software in prototype development and mass production
4. Optimum scalability through the use of identical hardware and software
   • Prototype development through to mass production
     • Table unit with 2 tester cards (S-TEST Lab)
     • Rack with 16 tester cards
     • Control cabinet with 96 tester cards (UTB)
     • Parallel connection of control cabinets possible
   • Sensor characterization in combination with various stimuli such as magnetic field, vibration, shock, temperature, ...
   • Synchronization through various trigger sources (DUT, handler, control software...)

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