DT

S-TEST Fab

S-TEST Fab solutions offer manufacturers a flexible platform to develop end-of-line system level tests for different types of sensors. The simple scalability of S-TEST installations allow efficient and multi-parallel testing of a large numbers of devices and a seamless integration into fab network infrastructures.

The hard- and software supports fast adaptation to changing sensor interfaces as well as easy integration with different sensor exciter systems. With these features the the S-TEST system provides a significant cost-benefit compared to classic semiconductor test systems.

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