DT

Measuring systems & Interface cards

bookmark_border
My Wishlist
Filter Products expand_more expand_less

Reset Filters

Frequency Rangeexpand_morechevron_right

Hz
Hz
chevron_right

Weightexpand_morechevron_right

g
g
chevron_right

Accelerationexpand_morechevron_right

m/s²
m/s²
chevron_right

Powerexpand_morechevron_right

N
N
chevron_right
Front view SPEKTRA_S-TEST/2

S-TEST/2

S-TEST/2

S-TEST/2 - Compact test system for digital sensors

Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.

Compact test system for digital sensors

chevron_right

S-TEST/16 Fab

S-TEST/16 Fab

S-TEST/16 Fab – Production test system for digital sensors

Compact system level test solution (SLT) for sensors with digital interfaces. Typical fields of application are mass production tests of sensors and quality assurance in sensor production.

Production test system for digital sensors

chevron_right

S-TEST/16 Lab

S-TEST/16 Lab

S-TEST/16 Lab - Efficient measurement system for digital sensors

Compact system level test solution (SLT) for sensors with digital interfaces. Development and testing of sensors or quality assurance in sensor manufacturing.

Efficient measurement system for digital sensors

chevron_right

S-TEST UTB (BSI) - Universal Tester Board

S-TEST UTB (BSI) - Universal Tester Board

Universally applicable board for efficient System Level Test (SLT) of digital sensors, sensor characterization testing or final tests in sensor mass production.

Efficient test system for digital sensors

chevron_right

S-TEST - Chassis Controller Board

S-TEST - Chassis Controller Board

Interface board for S-TEST system solutions

S-TEST communication interface

chevron_right

SPEKTRA S-TEST BSI SIR m 2 +

S-TEST/2m

S-TEST/2m

BSI-SIRm-2+

For the measurement of electrical properties of and communication with MEMS sensors.

System for measurement and communication of MEMS sensors

chevron_right

S-TEST FECB calibration bench

S-TEST FECB calibration bench

Calibration and adjustment of SPEKTRA table-top units / control cabinets BSI

mobile S-TEST calibration bench FECB

chevron_right

SPEKTRA exciter systems cover a wide spectrum of physical stimuli, like translation, rotation, magnet field or pressure to enable stimulated testing and calibration of a large variety of different sensors. Besides a standard-compliant calibration of sensor devices these exciter sytems are also used in complete system level test setups that include stimulus and sensor system testing.