The SPEKTRA calibration systems
Secondary calibration of measuring microphones, sound level meters and other acoustic sensors according to IEC 61094-8 and IEC 61672
Pressure chamber secondary calibration of measuring microphones acc. to IEC 61094-5
Pressure chamber secondary calibration of measuring microphones and microphone measuring chains
This section provides an overview of the product group Calibration Solutions, which covers both complete SPEKTRA calibration systems and our calibration services. Here, you will find answers to general questions about the topic Calibrating but also an insight into SPEKTRA specific solutions around the calibration system, the associated exciters as well as help to find the right solution for you.
Our range of measurands:
Calibration systems for amplitude-frequency response and displacement (sine) as well as comparison of peak amplitudes (shock).
Devices under test: Accelerometers, Seismic Sensors, Geophones, Vibration Calibrators, Measuring Equipment, Analyzers, Laser-Vibrometer, ...
Calibration Systems for free-field and pressure chamber
Devices under test: Sound Level Meters, Microphones, Acoustical calibrators, Pistonphones, Analyzers, Surface Microphones ...